Paper
13 June 2005 Performance evaluation of a residual stress measurement device using indentation and a radial in-plane ESPI interferometer
Ricardo Suterio, Armando Albertazzi G. Jr., Felipe Kleber Amaral, Anderson Pacheco
Author Affiliations +
Abstract
A radial in-plane electronic speckle pattern interferometer (ESPI) is used to measure residual stresses in combination with an indentation method. A semi-empirical mathematical model is developed to quantify the residual stresses from the radial in-plane displacement component measurement around the indentation print. Several tests were made in a specimen with different levels of residual stresses induced by mechanical loading. Correlation functions were fitted to tests results and are used to predict the residual stresses levels. This paper briefly presents the measurement principle, testing details and results of the performance evaluation. Finally, an uncertainty budget of the testing and measurement process was carried out. The tests presented here are not complete since they are restricted to only one material, oneaxis stress state, two indentation tip geometry and only one indentation force, but they are sufficient to encourage further development.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ricardo Suterio, Armando Albertazzi G. Jr., Felipe Kleber Amaral, and Anderson Pacheco "Performance evaluation of a residual stress measurement device using indentation and a radial in-plane ESPI interferometer", Proc. SPIE 5856, Optical Measurement Systems for Industrial Inspection IV, (13 June 2005); https://doi.org/10.1117/12.612615
Lens.org Logo
CITATIONS
Cited by 3 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Spherical lenses

Interferometers

Mirrors

Mathematical modeling

Measurement devices

Speckle pattern

Tungsten

Back to Top