Utilizing a TII aspherical measurement machine in a computer controlled polishing process

E. Pitschke; M. Schinhaerl; P. Sperber; R. Rascher

doi:10.1117/12.612597

13 June 2005 Utilizing a TII aspherical measurement machine in a computer controlled polishing process

E. Pitschke, M. Schinhaerl, P. Sperber, R. Rascher

Proceedings Volume 5856, Optical Measurement Systems for Industrial Inspection IV; (2005) https://doi.org/10.1117/12.612597
Event: Optical Metrology, 2005, Munich, Germany

Abstract

The demand on quality of optical surfaces is increasing from year to year. Computer controlled polishing is one way to fulfill these demands. The process depends on the error-profile of the optical surface. In this paper the usage of the TII measurement machine is discussed to manufacture optical surfaces.

Citation Download Citation

E. Pitschke, M. Schinhaerl, P. Sperber, and R. Rascher "Utilizing a TII aspherical measurement machine in a computer controlled polishing process", Proc. SPIE 5856, Optical Measurement Systems for Industrial Inspection IV, (13 June 2005); https://doi.org/10.1117/12.612597

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available