Paper
18 August 2005 Method for absolute measurements of reflectance and transmittance of specular samples with STAR GEM
Author Affiliations +
Abstract
A huge number of optical spectra have been measured in the ultraviolet, violet, visible, infrared and far-infrared regions. However transmittance and reflectance can only be measured by the use of a spectrometer, it is very difficult to measure the transmittance and reflectance with the same accuracy. Our STAR GEM (Scatter, Transmission and Absolute Reflection using a Geminated Ellipsoid Mirror) is the first realization not only to overcome the difficulty but also to make the absolute measurements of transmittance and reflectance at any incident angle. The STAR GEM is a new optical accessory and is designed so that it can be incorporated into commercial Fourier-transform infrared spectrometers. Although the STAR GEM is used for infrared spectral measurements, the measurement methods, design principles, and features are generally applicable to other wavelengths as well.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Etsuo Kawate "Method for absolute measurements of reflectance and transmittance of specular samples with STAR GEM", Proc. SPIE 5880, Optical Diagnostics, 58800X (18 August 2005); https://doi.org/10.1117/12.624858
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Reflectivity

Mirrors

Stars

Transmittance

Spectroscopy

Silicon

Sensors

Back to Top