Paper
1 May 1986 A Deep-Focus Attachment For A Far-Focus Thermal Imager System
F. J. J. Clarke
Author Affiliations +
Proceedings Volume 0590, Infrared Technology and Applications; (1986) https://doi.org/10.1117/12.951963
Event: 1985 International Technical Symposium/Europe, 1985, Cannes, France
Abstract
A supplementary infrared optical system has been developed at the National Physical Laboratory (NPL) to attach to a far-focus wide-angle telescope supplied for use with a TICM II thermal imager. It uses just two germanium lenses, of 75 mm and 90 mm diameter, and allows object distances from infinity down to 0.27 m. When combined with the high quality telescope and the scanner optics, the complete system has no discernible field curvature at any working distance, an important requirement for the NPL application of measuring the spatial distribution of emissivity of extended flat surfaces. The geometrical MTF data computed for 32 combinations of object distance, field angle and aperture plane show that under most conditions the effect of aberrations is significantly less than that of diffraction. In fact spatial resolution is ultimately limited by the diffusion spread in the detector, and the performance of the optical system is always fully adequate for the 512 x 512 pixel image processing involved.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
F. J. J. Clarke "A Deep-Focus Attachment For A Far-Focus Thermal Imager System", Proc. SPIE 0590, Infrared Technology and Applications, (1 May 1986); https://doi.org/10.1117/12.951963
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Modulation transfer functions

Telescopes

Nanolithography

Thermography

Space telescopes

Monochromatic aberrations

Diffraction

RELATED CONTENT


Back to Top