Paper
18 August 2005 Studies of interface polarization and magnetization dynamics using terahertz emission spectroscopy
Shayne M. Harrel, James M. Schleicher, Eric Beaurepaire, Jean-Yves Bigot, Charles A. Schmuttenmaer
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Abstract
Much can be learned about charge and magnetization dynamics at surfaces and in nanometer thickness films through terahertz emission spectroscopy (TES). In some respects, TES is the difference-frequency analog of second harmonic generation (SHG). As such, interface-specific properties contribute to the generation of a THz pulse upon ultrafast optical excitation. In addition, there can be bulk contributions as well, as is also true in SHG. The dependence of THz pulse emission on surface orientation has been used to study carrier dynamics, both real and virtual, in GaAs(111). We find that the dependence on the angle of linearly polarized excitation is well described by known theory. Magnetization dynamics in polycrystalline nickel films ranging in thickness from 5 nm to 60 nm have also been characterized with TES. Distinct bulk and surface contributions each play a role, and their origins are discussed.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shayne M. Harrel, James M. Schleicher, Eric Beaurepaire, Jean-Yves Bigot, and Charles A. Schmuttenmaer "Studies of interface polarization and magnetization dynamics using terahertz emission spectroscopy", Proc. SPIE 5929, Physical Chemistry of Interfaces and Nanomaterials IV, 592910 (18 August 2005); https://doi.org/10.1117/12.623174
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KEYWORDS
Terahertz radiation

Polarization

Frequency conversion

Gallium arsenide

Thin films

Magnetism

Ultrafast phenomena

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