Design of readout circuit with noise tolerant edge detection for InSb MWIR detector

Chul Bum Kim; Doo Hyung Woo; Yong Soo Lee; Hee Chul Lee

doi:10.1117/12.629648

11 October 2005 Design of readout circuit with noise tolerant edge detection for InSb MWIR detector

Chul Bum Kim, Doo Hyung Woo, Yong Soo Lee, Hee Chul Lee

Proceedings Volume 5987, Electro-Optical and Infrared Systems: Technology and Applications II; 59870O (2005) https://doi.org/10.1117/12.629648
Event: European Symposium on Optics and Photonics for Defence and Security, 2005, Bruges, Belgium

Abstract

In this paper, a readout circuit (ROIC) utilizing a novel noise tolerant edge detection technique for InSb medium wavelength infrared focal plane arrays (MWIR FPAs) is studied. The use of a noise tolerant edge detection algorithm eliminates the need for a pixel-level non-uniformity correction circuit. In addition, the proposed circuit's simple structure allows the processing circuits to be integrated within a shared 2 by 2 pixel area. The proposed method shows better performance for the Gaussian and salt & pepper noise than other conventional approaches. A good edge map is obtained in general InSb MWIR detectors which have 99.5% operability and about 5% non-uniformity of the pixel current. Basic operation of the fabricated noise tolerant edge detection circuit is demonstrated.

Citation Download Citation

Chul Bum Kim, Doo Hyung Woo, Yong Soo Lee, and Hee Chul Lee "Design of readout circuit with noise tolerant edge detection for InSb MWIR detector", Proc. SPIE 5987, Electro-Optical and Infrared Systems: Technology and Applications II, 59870O (11 October 2005); https://doi.org/10.1117/12.629648

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