Alignment of a Spectrometer for Soft X-Ray Laser Diagnostics

Hector Medecki

doi:10.1117/12.976191

12 May 1986 Alignment of a Spectrometer for Soft X-Ray Laser Diagnostics

Hector Medecki

Proceedings Volume 0608, Optical Alignment III; (1986) https://doi.org/10.1117/12.976191
Event: O-E/LASE'86 Symposium, 1986, Los Angeles, CA, United States

Abstract

The characterization of x-ray laser radiation requires the measurement of the radiation wavelengths, their brightness, and their temporal evolution. The spectrometer used for this application includes a focusing, grazing-incidence ellipsoidal mirror, a transmission grating for spectral resolution, and a soft x-ray streak camera to time-resolve and record the spectrum. This paper describes the bench alignment of the spectrometer and its alignment at the laser facility before each shot. Particular emphasis is put in the fact that only optical techniques were used for both alignments, relying on the correlation between the behavior of each component at optical and x-ray wavelengths.

Citation Download Citation

Hector Medecki "Alignment of a Spectrometer for Soft X-Ray Laser Diagnostics", Proc. SPIE 0608, Optical Alignment III, (12 May 1986); https://doi.org/10.1117/12.976191

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