Wavefront fitting of interferogram with Zernike polynomials based on SVD

Liping Chang; Zihua Wei; Weixing Shen; Zunqi Lin

doi:10.1117/12.677984

19 May 2006 Wavefront fitting of interferogram with Zernike polynomials based on SVD

Liping Chang, Zihua Wei, Weixing Shen, Zunqi Lin

Proceedings Volume 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 61500G (2006) https://doi.org/10.1117/12.677984
Event: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2005, Xian, China

Abstract

As the resolution of the interferometer is rapidly increasing, the higher requirement is proposed to the interferometry. For avoiding losing of the useful information of the actual interferogram, an algorithm is presented based on singular value decomposition (SVD) which is more stable than other algorithms to some extent. The weight coefficients of the orthogonal polynomials can be worked out directly, which can eliminate the computational error. Then an evaluation criterion is developed to choose the optimum Zernike polynomial number. The computer simulations of this algorithm are also made. The simulation experiments have proved that it is an efficient algorithm and can reconstruct the wavefront accurately and stably.

Citation Download Citation

Liping Chang, Zihua Wei, Weixing Shen, and Zunqi Lin "Wavefront fitting of interferogram with Zernike polynomials based on SVD", Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61500G (19 May 2006); https://doi.org/10.1117/12.677984

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