Calculation of extended bidirectional reflectance distribution function for subsurface defect scattering

Jian Shen; Shijie Liu; Weijin Kong; Zicai Shen; Jianda Shao; Zhengxiu Fan

doi:10.1117/12.678595

23 February 2006 Calculation of extended bidirectional reflectance distribution function for subsurface defect scattering

Jian Shen, Shijie Liu, Weijin Kong, Zicai Shen, Jianda Shao, Zhengxiu Fan

Author Affiliations +

Proceedings Volume 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 615035 (2006) https://doi.org/10.1117/12.678595
Event: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2005, Xian, China

Abstract

By introducing scattering probability and statistical distribution functions of substrate subsurface defects' radius, refractive indices and positions, extended bidirectional reflectance distribution function (BRDF) was derived on the foundation of Jones scattering matrix. A numerical calculation of the extended BRDF for p-polarization incident light has been performed by employing Monte Carlo method. The calculating results indicate that the extended BRDF depends strongly on incident angle, scattering angle and azimuth angle, and presents a specific symmetry. For real refractive index, the extended BRDF is independent of subsurface defects' positions. And the extended BRDF will provide a more precise model for the calculation and measurement of polarized light scattering resulting from subsurface defects.

Citation Download Citation

Jian Shen, Shijie Liu, Weijin Kong, Zicai Shen, Jianda Shao, and Zhengxiu Fan "Calculation of extended bidirectional reflectance distribution function for subsurface defect scattering", Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 615035 (23 February 2006); https://doi.org/10.1117/12.678595

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