Paper
9 June 2006 Deformations in Ti-diffused proton-exchanged x-cut LiNbO3 waveguide layers
D. I. Shevtsov, I. S. Azanova, I. F. Taysin, I. E. Kalabin, A. B. Volynzev, V. V. Atuchin
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Abstract
In this study the analysis of deformation and mode refractive index measurements of H:Ti:LiNbO3 layers have been investigated. The variations of the lattice parameter in doped layer have been controlled by high-resolution X-ray diffraction measurements. It has been shown that the presence of Ti greatly impacts on crystal lattice deformation induced by subsequent doping by hydrogen. The stability of H:Ti:LiNbO3 waveguides has been investigated by the high temperature phase freezing by quenching and relaxation to equilibrium phase at room temperature. The variation of the lattice parameter in H:Ti:LiNbO3 layer appears to be smaller then that in H:LiNbO3 layer formed at the same conditions.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
D. I. Shevtsov, I. S. Azanova, I. F. Taysin, I. E. Kalabin, A. B. Volynzev, and V. V. Atuchin "Deformations in Ti-diffused proton-exchanged x-cut LiNbO3 waveguide layers", Proc. SPIE 6258, ICONO 2005: Novel Photonics Materials: Physics and Optical Diagnostics of Nanostructures, 62580D (9 June 2006); https://doi.org/10.1117/12.677087
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Cited by 3 scholarly publications.
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KEYWORDS
Waveguides

Titanium

Crystals

Diffusion

Refractive index

X-ray diffraction

Annealing

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