Te inclusions and their relationship to the performance of CdZnTe detectors

G. A. Carini; A. E. Bolotnikov; G. S. Camarda; Y. Cui; H. Jackson; A. Burger; K. T. Kohman; L. Li; R. B. James

doi:10.1117/12.682982

11 September 2006 Te inclusions and their relationship to the performance of CdZnTe detectors

G. A. Carini, A. E. Bolotnikov, G. S. Camarda, Y. Cui, H. Jackson, A. Burger, K. T. Kohman, L. Li, R. B. James

Proceedings Volume 6319, Hard X-Ray and Gamma-Ray Detector Physics and Penetrating Radiation Systems VIII; 631906 (2006) https://doi.org/10.1117/12.682982
Event: SPIE Optics + Photonics, 2006, San Diego, California, United States

Abstract

Te-rich secondary phases existing in CdZnTe (CZT) single crystals degrade the spectroscopic performance of these detectors. An unpredictable number of charges are trapped, corresponding to the abundance of these microscopic defects, thereby leading to fluctuations in the total collected charge and strongly affecting the uniformity of charge-collection efficiency. These effects, observed in thin planar detectors, also were found to be the dominant cause of the low performance of thick detectors, wherein the fluctuations accumulate along the charge's drift path. Reducing the size of Te inclusions from a virtual diameter of 10-20 μm down to less than 5 μm already allowed us to produce Frisch-ring detectors with a resolution as good as ~0.8% FWHM at 662 keV. Understanding and modeling the mechanisms involving Te-rich secondary phases and charge loss requires systematic studies on a spatial scale never before realized. Here, we describe a dedicated beam-line recently established at BNL's National Synchrotron Light Source for characterizing semiconductor detectors along with a IR system with counting capability that permits us to correlate the concentration of defects with the devices' performances.

Citation Download Citation

G. A. Carini, A. E. Bolotnikov, G. S. Camarda, Y. Cui, H. Jackson, A. Burger, K. T. Kohman, L. Li, and R. B. James "Te inclusions and their relationship to the performance of CdZnTe detectors", Proc. SPIE 6319, Hard X-Ray and Gamma-Ray Detector Physics and Penetrating Radiation Systems VIII, 631906 (11 September 2006); https://doi.org/10.1117/12.682982

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