Paper
15 September 2006 Contouring of surfaces with discontinuities using ESPI
Author Affiliations +
Proceedings Volume 6341, Speckle06: Speckles, From Grains to Flowers; 634126 (2006) https://doi.org/10.1117/12.695491
Event: Speckle06: Speckles, From Grains to Flowers, 2006, Nimes, France
Abstract
Electronic speckle pattern interferometry (ESPI) can provide accurate contour measurements in the micron range and short measurement times far below one second. Typical surfaces in industrial applications, however, often show discontinuities, like steps or holes. An unambiguous measurement of such surfaces is possible, if the synthetic wavelength is chosen larger than the largest surface step. A long synthetic wavelength, however, introduces a high noise level such that an unambiguous measurement combined with a high accuracy is not possible in any case. Our preferred solution for this problem is the combination of two or more synthetic wavelengths. In contrast to other publications (hierarchical, pixel-wise approach) our area-based approach uses only two synthetic wavelengths minimizing measurement time and device complexity. In this paper we present different methods for merging the phase images of the two synthetic wavelengths into one measurement result combining accuracy and unambiguousness.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. W. Koch, A. Purde, and M. Jakobi "Contouring of surfaces with discontinuities using ESPI", Proc. SPIE 6341, Speckle06: Speckles, From Grains to Flowers, 634126 (15 September 2006); https://doi.org/10.1117/12.695491
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Cited by 1 scholarly publication.
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KEYWORDS
Image segmentation

Image fusion

Image processing algorithms and systems

Digital filtering

Time metrology

Resolution enhancement technologies

Data fusion

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