Paper
21 September 2006 Epitaxy of GaN LEDs on large substrates: Si or sapphire?
A. Dadgar, C. Hums, A. Diez, F. Schulze, J. Bläsing, A. Krost
Author Affiliations +
Proceedings Volume 6355, Advanced LEDs for Solid State Lighting; 63550R (2006) https://doi.org/10.1117/12.691576
Event: Asia-Pacific Optical Communications, 2006, Gwangju, South Korea
Abstract
We present first results on the limits of GaN growth on large diameter sapphire and the challenges that have to be solved for a successful growth of high power LEDs on silicon substrates. Up to 5.4 μm thick crack-free GaN on Si(111) LED structures were grown by metalorganic chemical vapor phase epitaxy. The FWHM of the GaN (0002) ω scan in x-ray diffraction amounts to 380 arcsec. On Si substrates, we achieve low curvatures with radii > 50 m, which is important for a successful processing of the samples on large diameter substrates. Additionally, a low curvature during InGaN multi-quantum-well growth is achieved and enables the growth of homogenous InGaN layers. The main difficulty for GaN-on-Si is light extraction, which leads to an approximately three- to four-fold reduction in direct comparison with GaN LEDs on sapphire.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. Dadgar, C. Hums, A. Diez, F. Schulze, J. Bläsing, and A. Krost "Epitaxy of GaN LEDs on large substrates: Si or sapphire?", Proc. SPIE 6355, Advanced LEDs for Solid State Lighting, 63550R (21 September 2006); https://doi.org/10.1117/12.691576
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Cited by 28 scholarly publications and 3 patents.
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KEYWORDS
Silicon

Light emitting diodes

Sapphire

Gallium nitride

Semiconducting wafers

Patterned sapphire substrate

Indium gallium nitride

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