Paper
10 April 2007 Nondestructive testing of ferroelectrics by thermal wave methods
Gerald Gerlach, Gunnar Suchaneck, Alena Movchikova, Olga Malyshkina
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Abstract
The application of thermal wave measurement techniques was demonstrated for Strontium Barium Niobate (SBN) and Lithium Tantalate (LT) crystals, Lead Zirconate Titanate (PZT) ceramics, and PZT thin films. We have investigated the influence of poling conditions and of chromium and cerium doping on the polarization distribution and domain wall pinning in SBN crystals, the impact of ion beam etching on the polarization distribution in high-detectivity LT infrared sensors, the influence of poling procedure on the polarization distribution of PZT piezoceramics, and the polarization distribution in self-polarized PZT thin films.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gerald Gerlach, Gunnar Suchaneck, Alena Movchikova, and Olga Malyshkina "Nondestructive testing of ferroelectrics by thermal wave methods", Proc. SPIE 6530, Sensor Systems and Networks: Phenomena, Technology, and Applications for NDE and Health Monitoring 2007, 65300B (10 April 2007); https://doi.org/10.1117/12.715534
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Cited by 4 scholarly publications.
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KEYWORDS
Ferroelectric materials

Crystals

Cerium

Chromium

Thin films

Modulation

Dielectric polarization

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