Paper
12 June 2007 Analysis of measurement uncertainty in THz-TDS
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Proceedings Volume 6593, Photonic Materials, Devices, and Applications II; 659326 (2007) https://doi.org/10.1117/12.721876
Event: Microtechnologies for the New Millennium, 2007, Maspalomas, Gran Canaria, Spain
Abstract
Measurement precision is often required in the process of material parameter extraction. This fact is applicable to terahertz time-domain spectroscopy (THz-TDS), which is able to determine the optical/dielectric constants of material in the T-ray regime. Essentially, an ultrafast-pulsed THz-TDS system is composed of several mechanical, optical, and electronic parts, each of which is limited in precision. In operation, the uncertainties of these parts, along with the uncertainties introduced during the parameter extraction process, contribute to the overall uncertainty appearing at the output, i.e. the uncertainty in the extracted optical constants. This paper analyzes the sources of uncertainty and models error propagation through the process.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
W. Withayachumnankul, H. Lin, S. P. Mickan, B. M. Fischer, and D. Abbott "Analysis of measurement uncertainty in THz-TDS", Proc. SPIE 6593, Photonic Materials, Devices, and Applications II, 659326 (12 June 2007); https://doi.org/10.1117/12.721876
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Cited by 21 scholarly publications.
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KEYWORDS
Terahertz radiation

Refractive index

Refraction

Mirrors

Signal to noise ratio

Beam splitters

Denoising

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