Paper
18 June 2007 The Confocal Raman AFM: a powerful tool for the characterization of surface coatings
U. Schmidt, W. Ibach, J. Mueller, O. Hollricher
Author Affiliations +
Abstract
The combination of an atomic force microscope (AFM) and a Confocal Raman Microscope (CRM) has been used to study various surface coatings. The high spatial resolution of the AFM enables the morphological characterization of the top layer of the coating with molecular resolution. Raman spectroscopy provides additional information on the chemical composition of the coatings. In combination with a confocal microscope, the spatial distribution of the various phases can be determined with a resolution down to 200 nm. Therefore, the topographically different structures observed in AFM images can be associated to the chemical composition by using the Confocal Raman Microscope (CRM). In addition, the confocal setup of the CRM provides insight into the multi-layer structure of coatings without laborious sample preparation.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
U. Schmidt, W. Ibach, J. Mueller, and O. Hollricher "The Confocal Raman AFM: a powerful tool for the characterization of surface coatings", Proc. SPIE 6616, Optical Measurement Systems for Industrial Inspection V, 66160E (18 June 2007); https://doi.org/10.1117/12.726059
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Cited by 4 scholarly publications.
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KEYWORDS
Raman spectroscopy

Confocal microscopy

Polymers

Microscopes

Atomic force microscopy

Polymer thin films

Spatial resolution

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