Paper
8 October 2007 Measurement of partially specular objects by controlling imaging range
Joongki Jeong, Deokhwa Hong, Hyungsuck Cho
Author Affiliations +
Proceedings Volume 6718, Optomechatronic Computer-Vision Systems II; 671808 (2007) https://doi.org/10.1117/12.754548
Event: International Symposium on Optomechatronic Technologies, 2007, Lausanne, Switzerland
Abstract
When specular surface is imaged on a group of CCD cells, the image usually suffers from saturation and blooming problem. This problem is a serious obstacle to applying optical profiling methods based on structured light to specular objects. In this paper, a phase-based profiling system combined with a spatial light modulator in the imaging part is proposed to measure three dimensional shape of partially specular surfaces. The spatial light modulator prevents the image sensor from being saturated. In this way, projected fringes are well imaged and their phase information is correctly extracted. The system configuration and transmittance control scheme are explained in sequence. This idea is verified by experimental results, in which phase information is successfully extracted from the areas which are not normally measurable due to saturation.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Joongki Jeong, Deokhwa Hong, and Hyungsuck Cho "Measurement of partially specular objects by controlling imaging range", Proc. SPIE 6718, Optomechatronic Computer-Vision Systems II, 671808 (8 October 2007); https://doi.org/10.1117/12.754548
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Cited by 12 scholarly publications.
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KEYWORDS
Cameras

Transmittance

Signal attenuation

3D metrology

Spatial light modulators

Imaging systems

Reflection

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