Paper
19 February 2008 Support for microsystems simulation: Are we watching the clock?
C. K. Drummond, F. J. Lisy
Author Affiliations +
Abstract
Real world Microsystems devices are multi-disciplinary, adaptive, and non-linear. Along the critical development path of Microsystems is a conspicuous absence of materials data, including materials compatibility and life models. To advance the state-of-the art in simulation, ASM has completed the first of three phases of a materials database development effort. The "strides and stumbles" associated with the database are discussed and opportunities for collaboration identified, particularly in the area of material reliability and harsh environment life prediction efforts. A materials database can benefit systems design and simulation efforts, but a phased approach to this undertaking is essential. Case-studies originally intended to validate the database became a surprising component of development strategy. ASM is seeking and welcomes opportunities for collaboration with other research groups as this interdisciplinary project moves forward.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
C. K. Drummond and F. J. Lisy "Support for microsystems simulation: Are we watching the clock?", Proc. SPIE 6884, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII, 68840S (19 February 2008); https://doi.org/10.1117/12.764500
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Cited by 1 scholarly publication.
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KEYWORDS
Databases

Microsystems

Computer aided design

Packaging

Tolerancing

Microelectromechanical systems

Reliability

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