Three-dimensional x-ray diffraction nanoscopy

Andrei Y. Nikulin; Ruben A. Dilanian; Nadia A. Zatsepin; Barry C. Muddle

doi:10.1117/12.795955

9 September 2008 Three-dimensional x-ray diffraction nanoscopy

Andrei Y. Nikulin, Ruben A. Dilanian, Nadia A. Zatsepin, Barry C. Muddle

Proceedings Volume 7042, Instrumentation, Metrology, and Standards for Nanomanufacturing II; 70420H (2008) https://doi.org/10.1117/12.795955
Event: NanoScience + Engineering, 2008, San Diego, California, United States

Abstract

A novel approach to x-ray diffraction data analysis for non-destructive determination of the shape of nanoscale particles and clusters in three-dimensions is illustrated with representative examples of composite nanostructures. The technique is insensitive to the x-rays coherence, which allows 3D reconstruction of a modal image without tomographic synthesis and in-situ analysis of large (over a several cubic millimeters) volume of material with a spatial resolution of few nanometers, rendering the approach suitable for laboratory facilities.

Citation Download Citation

Andrei Y. Nikulin, Ruben A. Dilanian, Nadia A. Zatsepin, and Barry C. Muddle "Three-dimensional x-ray diffraction nanoscopy", Proc. SPIE 7042, Instrumentation, Metrology, and Standards for Nanomanufacturing II, 70420H (9 September 2008); https://doi.org/10.1117/12.795955

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