Paper
20 May 2009 Defect study on several fluoride coatings
Yaoping Zhang, Yundong Zhang
Author Affiliations +
Abstract
Defect in thin film is one of the most important factors influencing laser-induced damage in infrared laser systems, and always a major concern. The infrared thin film is required for reflecting infrared and visible wavelengths, and the materials should be low-absorbing in the spectral wavelengths as well. In general, this multilayer coating consists of a number of high and low reflective index materials with alternate layers. Zinc Sulfide is used as high index material because it has good visible and IR optical properties. Low index material can be Thorium Fluoride, but ThF4 is radioactive and toxic, several fluoride coatings are studied in order to select an appropriate material instead of ThF4 in this paper. Single layer of YbF3, LaF3,YBC(a new combined fluoride) and PrF2 coating are produced by thermal evaporation, and classifications and derivation of defects in these thin films are introduced firstly. Then, the influence of depositing method on surface defect density of laser thin film is analyzed. Finally, result shows that YbF3 is an appropriate fluoride in place of ThF4, and the multilayer thin film deposited by YbF3 and ZnS material can be applied in infrared laser systems.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yaoping Zhang and Yundong Zhang "Defect study on several fluoride coatings", Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72832Q (20 May 2009); https://doi.org/10.1117/12.828724
Lens.org Logo
CITATIONS
Cited by 2 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Thin films

Thin film coatings

Resistance

Optical coatings

Deposition processes

Infrared radiation

Multilayers

Back to Top