Electro-optic sensors dedicated to noninvasive electric field characterization

A. Warzecha; M. Bernier; G. Gaborit; L. Duvillaret; J.-L. Lasserre

doi:10.1117/12.827509

17 June 2009 Electro-optic sensors dedicated to noninvasive electric field characterization

A. Warzecha, M. Bernier, G. Gaborit, L. Duvillaret, J.-L. Lasserre

Proceedings Volume 7389, Optical Measurement Systems for Industrial Inspection VI; 738922 (2009) https://doi.org/10.1117/12.827509
Event: SPIE Europe Optical Metrology, 2009, Munich, Germany

Abstract

This paper describes non-invasive electro-optic sensors devoted to simultaneous electric field and temperature measurements. Based on Poeckel's effect, these sensors consist in non-centrosymmetric crystals for which an electricfield induces a modification of their refractive indices [1]. Such modification can also be induced by a drift of the crystal temperature [2]. After explanation of the principle, we will illustrate some applications (high power microwave characterization, bioelectromagnetism, electric field mapping of high voltage devices) for which electro-optic sensors give excellent performances. These sensors perform vectorial E-field measurement (modulus and phase of each E-field components) with both high spatial and temporal resolutions. As they are pigtailed, long distance remote sensing is then allowed. They are also non-invasive due to their fully dielectric design. However, their sensitivity remains quite low for electromagnetic compatibility and their size remains too important for bioelectromagnetism studies in Petry dishes for example. So, two ways of improvement are pursued. The first one consists in using Fabry-Perot microcavities based on LiNbO3 optical waveguide to dramatically reduce sensors size. The second one consists in an optical processing (optical carrier rejection) of the laser probe beam to increase the sensor sensitivity for high frequency measurements. We will present first results concerning these improvements and also results that have been performed in free space with a fully automated setup in both frequency and time domains.

Citation Download Citation

A. Warzecha, M. Bernier, G. Gaborit, L. Duvillaret, and J.-L. Lasserre "Electro-optic sensors dedicated to noninvasive electric field characterization", Proc. SPIE 7389, Optical Measurement Systems for Industrial Inspection VI, 738922 (17 June 2009); https://doi.org/10.1117/12.827509

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available