Multiwavelength optical fiber refractive index profiling

Andrew D. Yablon

doi:10.1117/12.841883

17 February 2010 Multiwavelength optical fiber refractive index profiling

Andrew D. Yablon

Proceedings Volume 7580, Fiber Lasers VII: Technology, Systems, and Applications; 758015 (2010) https://doi.org/10.1117/12.841883
Event: SPIE LASE, 2010, San Francisco, California, United States

Abstract

Fourier transform spectroscopy and interference microscopy are combined to provide the world's first multi-wavelength optical fiber refractive index profile (RIP) measurements. The RIP and its spectral dependence are obtained with submicron spatial resolution across an octave stretching from about 500 nm to the 1 micron operating band of Yb-doped fiber lasers and amplifiers. In contrast to commercial Refracted Near Field (RNF) technology, which measures at a cleave, the technique described here measures transversely through the side of an uncleaved fiber, enabling measurements of axial fiber RIP variations found in fiber gratings, physical tapers, and fusion splices.

Citation Download Citation

Andrew D. Yablon "Multiwavelength optical fiber refractive index profiling", Proc. SPIE 7580, Fiber Lasers VII: Technology, Systems, and Applications, 758015 (17 February 2010); https://doi.org/10.1117/12.841883

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