Fast near-field imaging of spectrally broad sources using layered metallic structures

Kareem Elsayad; Alexander Urich; Karl Unterrainer; Katrin G Heinze

doi:10.1117/12.860940

10 September 2010 Fast near-field imaging of spectrally broad sources using layered metallic structures

Kareem Elsayad, Alexander Urich, Karl Unterrainer, Katrin G Heinze

Proceedings Volume 7757, Plasmonics: Metallic Nanostructures and Their Optical Properties VIII; 77573M (2010) https://doi.org/10.1117/12.860940
Event: SPIE NanoScience + Engineering, 2010, San Diego, California, United States

Abstract

Structures consisting of layered metallic films can be designed to have evanescent transmission and reflection coefficients that oscillate as a function of transverse wavevector and frequency. When combined with an exit face diffraction grating, a setup can be realized where for different frequencies one has different spatial components of an incident field scattered into the dominant propagating order behind the grating. One is thereby able to simultaneously gather information over a larger range of evanescent field components by combining measurements at more than one frequency. For sources emitting over the relevant frequency ranges, it becomes possible to reconstruct a higher ("super") resolution image in the far-field without the need for mechanical scanning or consecutive measurements. We present calculations and simulations demonstrating the operation of the proposed technique at visible frequencies along with some preliminary experimental results on the transmission properties of the proposed metal/dielectric stacks.

Citation Download Citation

Kareem Elsayad, Alexander Urich, Karl Unterrainer, and Katrin G Heinze "Fast near-field imaging of spectrally broad sources using layered metallic structures", Proc. SPIE 7757, Plasmonics: Metallic Nanostructures and Their Optical Properties VIII, 77573M (10 September 2010); https://doi.org/10.1117/12.860940

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