Multi-layer far-infrared component technology

Robert E. Peale; Justin W. Cleary; Walter R. Buchwald; Andrew Davis; Sandy Wentzel; Bill Stacy; Oliver Edwards

doi:10.1117/12.861598

15 September 2010 Multi-layer far-infrared component technology

Robert E. Peale, Justin W. Cleary, Walter R. Buchwald, Andrew Davis, Sandy Wentzel, Bill Stacy, Oliver Edwards

Proceedings Volume 7817, Nanophotonics and Macrophotonics for Space Environments IV; 78170D (2010) https://doi.org/10.1117/12.861598
Event: SPIE Optical Engineering + Applications, 2010, San Diego, California, United States

Abstract

Multi-layer thin-film optics based on alternating sub-wavelength layers of silicon and air provide high index contrast to create improved components with just a few layers. Applications include ultra-high reflectivity mirrors, band-pass and band-blocking filters, anti-reflection coatings, and compact high-resolution Fabry-Perot spectrometers with broad freespectral- range. Such components may be integrated directly into airborne/satellite and man-portable sensing instrumentation. We demonstrate a process to produce ultrathin silicon optical elements with an integral raised spacer rim to provide the requisite air gap when these elements are combined directly into a Bragg stack. Laboratory measurements confirm theoretical design specifications. Individual elements may be stacked and bonded to form Bragg mirrors and other thin-film optics.

Citation Download Citation

Robert E. Peale, Justin W. Cleary, Walter R. Buchwald, Andrew Davis, Sandy Wentzel, Bill Stacy, and Oliver Edwards "Multi-layer far-infrared component technology", Proc. SPIE 7817, Nanophotonics and Macrophotonics for Space Environments IV, 78170D (15 September 2010); https://doi.org/10.1117/12.861598

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