Statistical Characterization Of A Large PtSi Focal Plane Array

James E. Murguia; William S. Ewing

doi:10.1117/12.940566

24 September 1987 Statistical Characterization Of A Large PtSi Focal Plane Array

James E. Murguia, William S. Ewing

Proceedings Volume 0782, Infrared Sensors and Sensor Fusion; (1987) https://doi.org/10.1117/12.940566
Event: 1987 Technical Symposium Southeast on Optics, Electro-Optics, and Sensors, 1987, Orlando, FL, United States

Abstract

Schottky barrier diode charge coupled device infrared focal plane arrays exist with thousands of pixel elements. Fabrication of these large 2-D imagers is made possible by the simple design of the unit cell which can be repeated using modern CAD equipment as well as the maturity of the -2μm silicon process. Large 2-D imagers of the kind will invariably have different characteristics than their 1-D (-500 pixel element) scanning counterparts. The quantity of pixels in the Schottky array makes their characterization on a one by one basis an intractable problem. Instead, statistics can be used to quantify the array performance on a global scale. The use of statistics simplifies the extraction of uniquely two dimensional imager characteristics and system parameters.

Citation Download Citation

James E. Murguia and William S. Ewing "Statistical Characterization Of A Large PtSi Focal Plane Array", Proc. SPIE 0782, Infrared Sensors and Sensor Fusion, (24 September 1987); https://doi.org/10.1117/12.940566

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