3D profile measurement by using projection speckle pattern correlation method

Eryi Hu; Lixia Zhu

doi:10.1117/12.868510

11 November 2010 3D profile measurement by using projection speckle pattern correlation method

Eryi Hu, Lixia Zhu

Proceedings Volume 7855, Optical Metrology and Inspection for Industrial Applications; 78551F (2010) https://doi.org/10.1117/12.868510
Event: Photonics Asia 2010, 2010, Beijing, China

Abstract

This paper is based on the triangulation method and the random digital speckles are projected on the reference plane and the surface of the object, with the digital speckle correlation principle, solving the height of object and reconstructing three-dimension of the object. Experimental results indicate that the digital speckle correlation technology in the measurement of three-dimensional objects is validity, reliability.

Citation Download Citation

Eryi Hu and Lixia Zhu "3D profile measurement by using projection speckle pattern correlation method", Proc. SPIE 7855, Optical Metrology and Inspection for Industrial Applications, 78551F (11 November 2010); https://doi.org/10.1117/12.868510

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