UV-accelerated test based on analysis of field-exposed PV modules

T. Shioda

doi:10.1117/12.894597

21 September 2011 UV-accelerated test based on analysis of field-exposed PV modules

T. Shioda

Proceedings Volume 8112, Reliability of Photovoltaic Cells, Modules, Components, and Systems IV; 81120I (2011) https://doi.org/10.1117/12.894597
Event: SPIE Solar Energy + Technology, 2011, San Diego, California, United States

Abstract

We proposed an UV accelerated test condition for an EVA encapsulant, based on analysis of long term field exposed PV modules. We found that strong UV irradiation into EVA encapsulant test sample led to the fast decomposition of UV absorber formulated in EVA encapsulant, which has never seen in the field exposed PV modules. Thus, the integrating UV intensity of 60 W/m² and black panel temperature of 110°C using a xenon weather-o-meter were suitable as an UV accelerated test condition. With this proposed test condition, which shows that 1 week exposure by xenon light corresponds to 1 year field exposure, we can predict discoloration rate of EVA encapsulant. In addition, we evaluated change in peel strength to glass for Mitsui's and the other commercially available EVA encapsulants during UV accelerated test with the proposed condition. There was no large change in peel strength for our EVA encapsulant during the UV accelerated test. On the other hand, we observed that the competitor's EVA encapsulant showed the large decrease of peel strength to glass at early stage, even no change in yellowness index (YI). This result indicates not only YI change but also peel strength change should be evaluated for design of reliable PV module and encapsulant.

Citation Download Citation

T. Shioda "UV-accelerated test based on analysis of field-exposed PV modules", Proc. SPIE 8112, Reliability of Photovoltaic Cells, Modules, Components, and Systems IV, 81120I (21 September 2011); https://doi.org/10.1117/12.894597

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