Characterization of beryllium foils for coherent x-ray applications of synchrotron radiation and XFEL beamlines

Shunji Goto; Sunao Takahashi; Yuichi Inubushi; Kensuke Tono; Takahiro Sato; Makina Yabashi

doi:10.1117/12.894506

28 September 2011 Characterization of beryllium foils for coherent x-ray applications of synchrotron radiation and XFEL beamlines

Shunji Goto, Sunao Takahashi, Yuichi Inubushi, Kensuke Tono, Takahiro Sato, Makina Yabashi

Author Affiliations +

Proceedings Volume 8139, Advances in X-Ray/EUV Optics and Components VI; 813910 (2011) https://doi.org/10.1117/12.894506
Event: SPIE Optical Engineering + Applications, 2011, San Diego, California, United States

Abstract

New physical-vapor-deposited (PVD) beryllium foils were characterized using coherent x-rays at the 1-km-long beamline in the SPring-8. Non-uniformity in the 150 μmx150 μm area is 3% (rms) for 0.1-nm x-rays and 5% for 0.15-nm x-rays which are almost similar value to that of previous PVD foils. The PVD beryllium foil has a capability for synchrotron radiation and x-ray free electron laser applications with spatially coherent x-rays.

Citation Download Citation

Shunji Goto, Sunao Takahashi, Yuichi Inubushi, Kensuke Tono, Takahiro Sato, and Makina Yabashi "Characterization of beryllium foils for coherent x-ray applications of synchrotron radiation and XFEL beamlines", Proc. SPIE 8139, Advances in X-Ray/EUV Optics and Components VI, 813910 (28 September 2011); https://doi.org/10.1117/12.894506

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