Paper
27 September 2011 Effects of thermal annealing on the structural properties of CdZnTe crystals
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Abstract
Although cadmium zinc telluride (CZT) is one of leading materials for fabricating room-temperature nuclear-radiation- detectors, different defects in the crystals can degrade the performance of CZT detectors. Post-growth thermal annealing potentially offers a satisfactory way to eliminate the deleterious influence of these defects. Here, we report that the annealing of CZT in Cd vapor effectively lowers the density of Te inclusions. It takes a much longer annealing time to eliminate separate large Te inclusions than small ones; however, the annealing time is greatly reduced when the large Te inclusions are distributed along grain boundaries. We found that sub-grain boundaries still exist after the annealing at 500 °C, indicating that a higher annealing temperature might be needed.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
G. Yang, A. E. Bolotnikov, P. M. Fochuk, Y. Cui, G. S. Camarda, A. Hossain, K. H. Kim, J. Horace, B. McCall, R. Gul, O. V. Kopach, S. U. Egarievwe, and R. B. James "Effects of thermal annealing on the structural properties of CdZnTe crystals", Proc. SPIE 8142, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII, 814217 (27 September 2011); https://doi.org/10.1117/12.894961
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Annealing

Tellurium

Crystals

Infrared imaging

Cadmium

Sensors

Thermal effects

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