Low frequency noise in 1024x1024 long wavelength infrared focal plane array based on type-II InAs/GaSb superlattice

A. Haddadi; S. R. Darvish; G. Chen; A. M. Hoang; B.-M. Nguyen; M. Razeghi

doi:10.1117/12.913983

20 January 2012 Low frequency noise in 1024×1024 long wavelength infrared focal plane array based on type-II InAs/GaSb superlattice

A. Haddadi, S. R. Darvish, G. Chen, A. M. Hoang, B.-M. Nguyen, M. Razeghi

Author Affiliations +

Proceedings Volume 8268, Quantum Sensing and Nanophotonic Devices IX; 82680X (2012) https://doi.org/10.1117/12.913983
Event: SPIE OPTO, 2012, San Francisco, California, United States

Abstract

Recently, the type-II InAs/GaSb superlattice (T2SL) material platform is considered as a potential alternative for HgCdTe technology in long wavelength infrared (LWIR) imaging. This is due to the incredible growth in the understanding of its material properties and improvement of device processing which leads to design and fabrication of better devices. In this paper, we report electrical low frequency noise measurement on a high performance type-II InAs/GaSb superlattice 1024×1024 LWIR focal plane array.

Citation Download Citation

A. Haddadi, S. R. Darvish, G. Chen, A. M. Hoang, B.-M. Nguyen, and M. Razeghi "Low frequency noise in 1024×1024 long wavelength infrared focal plane array based on type-II InAs/GaSb superlattice", Proc. SPIE 8268, Quantum Sensing and Nanophotonic Devices IX, 82680X (20 January 2012); https://doi.org/10.1117/12.913983

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