Investigating spectrograph design parameters with the Yale Doppler diagnostic facility

Christian Schwab; Thales Gutcke; Julien F. P. Spronck; Debra A Fischer; Andrew Szymkowiak

doi:10.1117/12.926357

24 September 2012 Investigating spectrograph design parameters with the Yale Doppler diagnostic facility

Christian Schwab, Thales Gutcke, Julien F. P. Spronck, Debra A Fischer, Andrew Szymkowiak

Proceedings Volume 8446, Ground-based and Airborne Instrumentation for Astronomy IV; 844695 (2012) https://doi.org/10.1117/12.926357
Event: SPIE Astronomical Telescopes + Instrumentation, 2012, Amsterdam, Netherlands

Abstract

The detection of earth-like exoplanets with the Doppler technique requires extreme precision spectrographs stable over timescales of years. The precision requirement of 10 cm/s is equivalent to a relative uncertainty of 3x10^-10, and, with the typical dispersion of the Echelle spectrographs used for this purpose, translates to a shift of a few nanometers of the spectrum on the detector. Consequently, the instrument must be well understood and optimized in every component and detail. We describe the Yale Doppler diagnostic facility (YDDF), a dedicated bench mounted Echelle spectrograph in our lab at Yale University, which will be used to systematically study the influence of different components at this precision level. The spectrograph bench allows for a flexible optical configuration, high resolution and sampling, and wide spectral coverage. Further, we incorporated a turbulence and guiding simulator to realistically reproduce the situation at the telescope, enabling end-to-end tests of important parameters.

Citation Download Citation

Christian Schwab, Thales Gutcke, Julien F. P. Spronck, Debra A Fischer, and Andrew Szymkowiak "Investigating spectrograph design parameters with the Yale Doppler diagnostic facility", Proc. SPIE 8446, Ground-based and Airborne Instrumentation for Astronomy IV, 844695 (24 September 2012); https://doi.org/10.1117/12.926357

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