Theoretical investigation of scattering properties of crystal exposed to the XFEL femtosecond pulse

Aleksandr Leonov; Dmitriy Ksenzov; Andrei Benediktovitch; Ilya Feranchuk; Ullrich Pietsch

doi:10.1117/12.2017453

3 May 2013 Theoretical investigation of scattering properties of crystal exposed to the XFEL femtosecond pulse

Aleksandr Leonov, Dmitriy Ksenzov, Andrei Benediktovitch, Ilya Feranchuk, Ullrich Pietsch

Proceedings Volume 8777, Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III; 87770E (2013) https://doi.org/10.1117/12.2017453
Event: SPIE Optics + Optoelectronics, 2013, Prague, Czech Republic

Abstract

Interaction of the X-ray Free Electron Laser (XFEL) femtosecond pulses with a crystal is investigated beyond the means of the conventional linear response theory. In order to analyze the time dependence of the X-ray scattering properties of a crystal we analyze the electron density evolution on the basis of rate equations.¹ In order to take into account the influence of the electron plasma that appears due to the ionization of the atoms of a crystal we couple the system of rate equations to the Boltzmann kinetic equation. As a result, the system of master equations involves such evolution channels as: photoionization, Auger recombination, electron impact ionization, electron-electron scattering and three body recombination. In order to consider these channels effectively expressions for the cross sections of these processes are calculated within the framework of the effective charge approximation.² The numerical algorithm and software are developed for calculation of the intensity of the diffraction reflection of the XFEL pulse taking into account the specific characteristics of the kinetic processes in a crystal. Numerical results are analyzed on the example of the Si crystal in the wide range of the pulse parameters variation.

Citation Download Citation

Aleksandr Leonov, Dmitriy Ksenzov, Andrei Benediktovitch, Ilya Feranchuk, and Ullrich Pietsch "Theoretical investigation of scattering properties of crystal exposed to the XFEL femtosecond pulse", Proc. SPIE 8777, Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III, 87770E (3 May 2013); https://doi.org/10.1117/12.2017453

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
8 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Crystals

Chemical species

Ionization

Scattering

X-rays

Femtosecond phenomena

Silicon

Show All Keywords

Keywords/Phrases

Search In:

Publication Years