Analysis of scintillator crystal production via the edge-defined film-fed growth method

Andrew Yeckel; Robert S. Feigelson; Jeffrey J. Derby

doi:10.1117/12.2027535

26 September 2013 Analysis of scintillator crystal production via the edge-defined film-fed growth method

Andrew Yeckel, Robert S. Feigelson, Jeffrey J. Derby

Proceedings Volume 8852, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XV; 88520V (2013) https://doi.org/10.1117/12.2027535
Event: SPIE Optical Engineering + Applications, 2013, San Diego, California, United States

Abstract

A model of edge-defined film-fed (EFG) crystal growth is developed to study melt growth of cylinders of the scintillator crystal cesium iodide (CsI). This system is characterized by strongly nonlinear interactions of heat transfer, capillarity, and die geometry that give rise to multiple solution states under a single set of operating conditions. A thermal-capillary instability is identified that stems from meniscus sag due to gravity, which causes an inflection point to appear in the meniscus shape. This shape allows two solutions to coexist that correspond to different crystal diameters and gap sizes (axial length of liquid bridge between die and crystal). Also identified is an instability of convective heat transfer characterized by a strong interaction of thermal convection with the geometry of the growth interface.

Citation Download Citation

Andrew Yeckel, Robert S. Feigelson, and Jeffrey J. Derby "Analysis of scintillator crystal production via the edge-defined film-fed growth method", Proc. SPIE 8852, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XV, 88520V (26 September 2013); https://doi.org/10.1117/12.2027535

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