Designing the x-ray microcalorimeter spectrometer for optimal science return

Andrew Ptak; Simon R. Bandler; Jay Bookbinder; Richard L. Kelley; Robert Petre; Randall K. Smith; Stephen Smith

doi:10.1117/12.2024423

26 September 2013 Designing the x-ray microcalorimeter spectrometer for optimal science return

Andrew Ptak, Simon R. Bandler, Jay Bookbinder, Richard L. Kelley, Robert Petre, Randall K. Smith, Stephen Smith

Proceedings Volume 8859, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XVIII; 885903 (2013) https://doi.org/10.1117/12.2024423
Event: SPIE Optical Engineering + Applications, 2013, San Diego, California, United States

Abstract

Recent advances in X-ray microcalorimeters enable a wide range of possible focal plane designs for the X-ray Microcalorimeter Spectrometer (XMS) instrument on the future Advanced X-ray Spectroscopic Imaging Observatory (AXSIO) or X-ray Astrophysics Probe (XAP). Small pixel designs (75 μm) oversample a 5-10″ PSF by a factor of 3-6 for a 10 m focal length, enabling observations at both high count rates and high energy resolution. Pixel designs utilizing multiple absorbers attached to single transition-edge sensors can extend the focal plane to cover a significantly larger field of view, albeit at a cost in maximum count rate and energy resolution. Optimizing the science return for a given cost and/or complexity is therefore a non-trivial calculation that includes consideration of issues such as the mission science drivers, likely targets, mirror size, and observing efficiency. We present a range of possible designs taking these factors into account and their impacts on the science return of future large effective-area X-ray spectroscopic missions.

Citation Download Citation

Andrew Ptak, Simon R. Bandler, Jay Bookbinder, Richard L. Kelley, Robert Petre, Randall K. Smith, and Stephen Smith "Designing the x-ray microcalorimeter spectrometer for optimal science return", Proc. SPIE 8859, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XVIII, 885903 (26 September 2013); https://doi.org/10.1117/12.2024423

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KEYWORDS

X-rays

Sensors

Spectral resolution

Spectroscopy

Image resolution

Point spread functions

X-ray imaging

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