Paper
14 November 2013 Laser damage in dielectric films: What we know and what we don't
Author Affiliations +
Abstract
Damage mechanisms in thin films are reviewed from femtosecond pulse to CW laser illumination. Special emphasis is given to the role of native and laser induced defects, recent successes and the need for better diagnostic tools.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wolfgang Rudolph, Luke Emmert, Zhanliang Sun, Dinesh Patel, and Carmen Menoni "Laser damage in dielectric films: What we know and what we don't", Proc. SPIE 8885, Laser-Induced Damage in Optical Materials: 2013, 888516 (14 November 2013); https://doi.org/10.1117/12.2030894
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Cited by 11 scholarly publications.
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KEYWORDS
Absorption

Laser induced damage

Electrons

Thin films

Continuous wave operation

Microscopy

Scattering

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