Paper
23 August 2013 Inline contaminants detection with optical microfiber in high-power laser system
Author Affiliations +
Proceedings Volume 8911, International Symposium on Photoelectronic Detection and Imaging 2013: Micro/Nano Optical Imaging Technologies and Applications; 891104 (2013) https://doi.org/10.1117/12.2031616
Event: ISPDI 2013 - Fifth International Symposium on Photoelectronic Detection and Imaging, 2013, Beijing, China
Abstract
The rudimental microparticle contaminants and airborne molecular contaminants (AMCs) will obviously reduce the lifetime of the lens widely used in the high peak power laser system. An inline contaminants sensor based on the optical microfiber (OM) is here proposed. Due to Van Der Waals force and electrostatic attraction, contaminants are easily adhered to the surface of OM, which will cause an obvious perturbation to the evanescent field transmitted in the OM. The additional loss, caused by the adhered contaminants, has been theoretically analyzed and simulated. The corresponding experiments have also been carried out, and the experimental results agree well with the simulation. The inline containments sensor based on OM has potentially wide sensing range for many kinds of determinate absorptive materials.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhengtong Wei, Zhangqi Song, Yang Yu, Xueliang Zhang, and Zhou Meng "Inline contaminants detection with optical microfiber in high-power laser system", Proc. SPIE 8911, International Symposium on Photoelectronic Detection and Imaging 2013: Micro/Nano Optical Imaging Technologies and Applications, 891104 (23 August 2013); https://doi.org/10.1117/12.2031616
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Cited by 2 scholarly publications.
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KEYWORDS
Particles

Sensors

Glasses

Laser systems engineering

Optical fibers

Refractive index

High power lasers

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