Determination Of Fields Near A Silver Strip On A Glass Substrate

Egon Marx; E.Clayton Teague

doi:10.1117/12.944541

12 July 1988 Determination Of Fields Near A Silver Strip On A Glass Substrate

Egon Marx, E.Clayton Teague

Proceedings Volume 0897, Scanning Microscopy Technologies and Applications; (1988) https://doi.org/10.1117/12.944541
Event: 1988 Los Angeles Symposium: O-E/LASE '88, 1988, Los Angeles, CA, United States

Abstract

The theory and numerical considerations that are used in the computation of the scattered electromagnetic fields near the surface of a silver strip on a glass substrate are presented. These calculations provide theoretical guidance for the measurement of the width of the strip by means of near-field optical scanning. The dimensions of the strip cross section, e. g. 300 nm by 100 nm, can be a fraction of the wavelength of the incident light, 632.8 nm. The flux 1 nm above the surface shows sharp spikes at the edges of the strip. The features of the fields near such a surface could be used for accurate width measurements up to about 30 nm above the strip. The effects of other variables are also shown in the figures.

Citation Download Citation

Egon Marx and E.Clayton Teague "Determination Of Fields Near A Silver Strip On A Glass Substrate", Proc. SPIE 0897, Scanning Microscopy Technologies and Applications, (12 July 1988); https://doi.org/10.1117/12.944541

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