Single-shot two-channel Talbot interferometry using checker grating and Hilbert-Huang fringe pattern processing

K. Patorski; M. Trusiak; K. Pokorski

doi:10.1117/12.2051383

1 May 2014 Single-shot two-channel Talbot interferometry using checker grating and Hilbert-Huang fringe pattern processing

K. Patorski, M. Trusiak, K. Pokorski

Author Affiliations +

Proceedings Volume 9132, Optical Micro- and Nanometrology V; 91320Z (2014) https://doi.org/10.1117/12.2051383
Event: SPIE Photonics Europe, 2014, Brussels, Belgium

Abstract

Diffraction efficiency and image processing enhanced two-dimensional Talbot shearing interferometry providing phase object derivative information in two mutually orthogonal directions is proposed. The properties of the Talbot interferometer using amplitude checker grating are studied and its performance is compared with a common configuration based on the cross-type amplitude Ronchi grids. Besides the light output gain further setup attractiveness is related to conducting the automatic fringe pattern analysis guided by recently introduced Hilbert-Huang processing for single exposure two-dimensional grating interferometry. The checker grating self-image deformed by the object under test is resolved into two linear fringe families running in 45/135 deg directions with respect to checker grating lines. Next the separated fringe sets are filtered using automatic selective reconstruction aided by enhanced fast empirical mode decomposition and mutual information detrending. Finally the Hilbert spiral transform is implemented to retrieve phase maps representing first derivatives of the object phase distribution. Efficient adaptive digital filtering enables analysis of complex patterns without resorting to coherent spatial filtering resulting in complicated and bulky experimental setups. Numerical and experimental studies corroborate the robustness and versatility of the proposed approach.

Citation Download Citation

K. Patorski, M. Trusiak, and K. Pokorski "Single-shot two-channel Talbot interferometry using checker grating and Hilbert-Huang fringe pattern processing", Proc. SPIE 9132, Optical Micro- and Nanometrology V, 91320Z (1 May 2014); https://doi.org/10.1117/12.2051383

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