Open Access Paper
2 October 2014 Integrating electron microscopy into nanoscience and materials engineering programs
Robert D. Cormia, Michael M. Oye, Anh Nguyen, David Skiver, Meng Shi, Yessica Torres
Author Affiliations +
Proceedings Volume 9236, Scanning Microscopies 2014; 92360N (2014) https://doi.org/10.1117/12.2066250
Event: SPIE Scanning Microscopies, 2014, Monterey, California, United States
Abstract
Preparing an effective workforce in high technology is the goal of both academic and industry training, and has been the engine that drives innovation and product development in the United States for over a century. During the last 50 years, technician training has comprised a combination of two-year academic programs, internships and apprentice training, and extensive On-the-Job Training (OJT). Recently, and especially in Silicon Valley, technicians have four-year college degrees, as well as relevant hands-on training. Characterization in general, and microscopy in particular, is an essential tool in process development, manufacturing and QA/QC, and failure analysis. Training for a broad range of skills and practice is challenging, especially for community colleges. Workforce studies (SRI/Boeing) suggest that even four year colleges often do not provide the relevant training and experience in laboratory skills, especially design of experiments and analysis of data. Companies in high-tech further report difficulty in finding skilled labor, especially with industry specific experience. Foothill College, in partnership with UCSC, SJSU, and NASA-Ames, has developed a microscopy training program embedded in a research laboratory, itself a partnership between university and government, providing hands-on experience in advanced instrumentation, experimental design and problem solving, with real-world context from small business innovators, in an environment called ‘the collaboratory’. The program builds on AFM-SEM training at Foothill, and provides affordable training in FE-SEM and TEM through a cost recovery model. In addition to instrument and engineering training, the collaboratory also supports academic and personal growth through a multiplayer social network of students, faculty, researchers, and innovators.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert D. Cormia, Michael M. Oye, Anh Nguyen, David Skiver, Meng Shi, and Yessica Torres "Integrating electron microscopy into nanoscience and materials engineering programs", Proc. SPIE 9236, Scanning Microscopies 2014, 92360N (2 October 2014); https://doi.org/10.1117/12.2066250
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KEYWORDS
Microscopy

Transmission electron microscopy

Scanning electron microscopy

Atomic force microscopy

Thin films

Analytical research

Atomic force microscope

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