Optical nonlinearities of InN by reflection Z-scan technique

Jiping Jia; Yong Yang; Yunyi Yang; Zhengguo Xiao; Yu Fang; Yinglin Song

doi:10.1117/12.2073046

3 December 2014 Optical nonlinearities of InN by reflection Z-scan technique

Jiping Jia, Yong Yang, Yunyi Yang, Zhengguo Xiao, Yu Fang, Yinglin Song

Proceedings Volume 9297, International Symposium on Optoelectronic Technology and Application 2014: Laser and Optical Measurement Technology; and Fiber Optic Sensors; 92971Q (2014) https://doi.org/10.1117/12.2073046
Event: International Symposium on Optoelectronic Technology and Application 2014, 2014, Beijing, China

Abstract

The optical nonlinearities of semiconductor bulk material Indium nitride (InN) have been investigated by Reflection Z-scan technique (RZ-scan) at the wavelength of 532nm with 21ps laser pulse. Top hat beam is used in order to get high spatial quality. Different from the normal RZ-scan device, instead of moving the sample, the lens before the sample is moved along z-axis. This can guarantee the stability of the spot on the surface of the sample and the measurement accuracy. The measurement of nonlinear refraction without aperture should be tested first, and then with a small aperture nonlinear absorption coefficient is measured. The experimental results show that InN has positive nonlinear refraction and saturable absorption effect. Nonlinear refraction and absorption coefficient are obtained by fitting theoretical simulation with experimental data.

Citation Download Citation

Jiping Jia, Yong Yang, Yunyi Yang, Zhengguo Xiao, Yu Fang, and Yinglin Song "Optical nonlinearities of InN by reflection Z-scan technique", Proc. SPIE 9297, International Symposium on Optoelectronic Technology and Application 2014: Laser and Optical Measurement Technology; and Fiber Optic Sensors, 92971Q (3 December 2014); https://doi.org/10.1117/12.2073046

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