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The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org. The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon. Please use the following format to cite material from this proceedings: Author(s), “Title of Paper,” in Advances in X-Ray/EUV Optics and Components X, edited by Shunji Goto, Christian Morawe, Ali M. Khounsary, Proceedings of SPIE Vol. 9588 (SPIE, Bellingham, WA, 2015) Six-digit Article CID Number. ISSN: 0277-786X ISSN:1996-756X (electronic) ISBN: 9781628417548 Published by SPIE P.O. Box 10, Bellingham, Washington 98227-0010 USA Telephone +1 360 676 3290 (Pacific Time)· Fax +1 360 647 1445 Copyright © 2015, Society of Photo-Optical Instrumentation Engineers. Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of copying fees. The Transactional Reporting Service base fee for this volume is $18.00 per article (or portion thereof), which should be paid directly to the Copyright Clearance Center (CCC), 222 Rosewood Drive, Danvers, MA 01923. Payment may also be made electronically through CCC Online at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. The CCC fee code is 0277-786X/15/$18.00. Printed in the United States of America. Publication of record for individual papers is online in the SPIE Digital Library. Paper Numbering: Proceedings of SPIE follow an e-First publication model, with papers published first online and then in print. Papers are published as they are submitted and meet publication criteria. A unique citation identifier (CID) number is assigned to each article at the time of the first publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online, print, and electronic versions of the publication. SPIE uses a six-digit CID article numbering system in which:
AuthorsNumbers in the index correspond to the last two digits of the six-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first four digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc. Adams, Bernhard, 0D Antimonov, M., 0F Attenkofer, Klaus, 0D Bacco, Davide, 02 Barrett, R., 03 Bencivenga, Filippo, 02 Bennis, Daniel, 0D Bond, Justin L., 0D Cappuccio, G., 0E Cloetens, P., 03 Corso, Alain Jody, 02 Craven, Christopher A., 0D Dabagov, S. B., 0E Dennetiere, D., 05 Do, A., 05 Döring, Florian, 08 Eberl, Christian, 08 Egawa, Satoru, 0L Foley, Michael R., 0D Gerlin, Francesca, 02 Gessini, Alessandro, 02 Giangrisostomi, Erika, 02 Giglia, A., 02 Gontier, D., 05 Goto, Shunji, 0G Halahovets, Yuriy, 04 Hampai, D., 0E Hedacq, S., 05 Higashi, Takahiro, 0L Hodas, Martin, 04 Høghøj, P., 05 Jansma, W., 0F Jergel, Matej, 04 Johnson, A., 0F Khounsary, A., 0F Krebs, Hans-Ulrich, 08 Kume, Takehiro, 0L Lantelme, B., 03 Liedl, A., 0E Majkova, Eva, 04 Masciovecchio, C., 02 Mimura, Hidekazu, 0A, 0L Minot, Michael J., 0D Morawe, Ch., 03 Motoyama, Hiroto, 0L Nannarone, S., 02 Nardello, Marco, 02 O’Mahony, Aileen, 0D Osterhoff, Markus, 08 Pace, E., 0E Peffen, J.-Ch., 03 Pelizzo, Maria Guglielmina, 02 Pelletta, Marco, 04 Polese, C., 0E Popecki, Mark A., 0D Principi, Emiliano, 02 Renaud, Joseph M., 0D Grudzinkski, J. J., 0F Saito, Takahiro, 0A, 0L Siffalovic, Peter, 04 Stavitski, Eli, 0D Stochaj, Michael E., 0D Takei, Yoshinori, 0L Takeo, Yoko, 0A, 0L Tessarolo, Enrico, 02 Troussel, Ph., 05 Vegso, Karol, 04 Vivo, A., 03 Weigland, S., 0F Zhou, Z., 0F Zuppella, Paola, 02 Conference CommitteeProgram Track Chairs
Conference Chairs
Conference Program Committee
Session Chairs
IntroductionThis volume contains papers presented at the conference on “Advances in X-Ray/EUV Optics and Components X,” which was held in San Diego, California, United States on 11–12 August 2015 as part of the SPIE 2015 International Symposium on Optics + Photonics. The conference was composed of five oral sessions: Multilayers, Focusing, Optics Development and Fabrication, Instrumentation and Imaging, and Optics for Coherent Sources. The final session was held jointly with the conference on “X-ray Lasers and Coherent X-Ray Sources: Development and Application XI.” The focus of the conference was technological developments in X-ray/EUV optics for synchrotron and FEL beamlines. Presentations covered a wide spectrum, from vacuum ultra violet to hard X-rays. Topics related to X-ray lasers, coherent X-ray sources, laboratory-based X-ray sources, and X-ray imaging were presented in independent conferences at the same symposium. Scheduled for nearly one and a half days of oral presentations with an accompanying evening poster session, the conference was lively and well attended. We would like to thank the authors, speakers, session and joint session chairs, program committee members, the conference participants for their contributions, and the SPIE staff for their help in organizing the conference. Shunji Goto Christian Morawe Ali M. Khounsary |
