Open Access Paper
24 August 2015 Front Matter: Volume 9660
Proceedings Volume 9660, SPECKLE 2015: VI International Conference on Speckle Metrology; 966001 (2015) https://doi.org/10.1117/12.2206040
Event: SPECKLE 2015: VI International Conference on Speckle Metrology, 2015, Guanajuato, Mexico
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 9660, including the Title Page, Copyright information, Table of Contents, Introduction (if any), and Conference Committee listing.

The papers included in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. The papers published in these proceedings reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from this book:

Author(s), “Title of Paper,” in SPECKLE 2015: VI International Conference on Speckle Metrology, edited by Fernando Mendoza Santoyo, Eugenio R. Méndez, Proceedings of SPIE Vol. 9660 (SPIE, Bellingham, WA, 2015) Article CID Number.

ISSN: 0277-786X

ISBN: 9781628418781

Published by

SPIE

P.O. Box 10, Bellingham, Washington 98227-0010 USA

Telephone +1 360 676 3290 (Pacific Time)· Fax +1 360 647 1445

SPIE.org

Copyright © 2015, Society of Photo-Optical Instrumentation Engineers.

Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of copying fees. The Transactional Reporting Service base fee for this volume is $18.00 per article (or portion thereof), which should be paid directly to the Copyright Clearance Center (CCC), 222 Rosewood Drive, Danvers, MA 01923. Payment may also be made electronically through CCC Online at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. The CCC fee code is 0277-786X/15/$18.00.

Printed in the United States of America.

Publication of record for individual papers is online in the SPIE Digital Library.

00001_psisdg9660_966001_page_2_1.jpg

Paper Numbering: Proceedings of SPIE follow an e-First publication model, with papers published first online and then in print. Papers are published as they are submitted and meet publication criteria. A unique citation identifier (CID) number is assigned to each article at the time of the first publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online, print, and electronic versions of the publication. SPIE uses a six-digit CID article numbering system in which:

  • The first four digits correspond to the SPIE volume number.

  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc.

The CID Number appears on each page of the manuscript. The complete citation is used on the first page, and an abbreviated version on subsequent pages.

Authors

Numbers in the index correspond to the last two digits of the six-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first four digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Abboud, Marie, 0D, 0X

Abou Nader, Christelle, 0D, 0X

Abregana, Timothy Joseph T., 0F

Agarwal, Shilpi, 0S

Albertazzi G. Jr., Armando, 06

Almoro, Percival F., 0F

Amer, Eynas, 0V, 1E

Arai, Y., 14

Arias-Cruz, Jose Angel, 1O

Arrieta, Emiro S., 1P

Aulbach, Laura M., 0Y

Avendaño Montecinos, Marcos, 1Z

Baharev, A. A., 1M

Baradit, Erik, 1Z

Beaumont, Florent, 0J

Bennis, N., 0W

Bolognini, Nestor, 1P

Briones-R., Manuel de J., 1I

Budini, N., 1Q

Cap, Nelly, 1Z

Chakrabarti, Maumita, 0U, 1J

Coyotl-Ocelotl, B., 1X

Darias, J. G., 1U

Daza, Carolina, 1V

De La Torre-Ibarra, Manuel H., 1A, 1I

De Silva, Kokge Thilini Kanchana Muthumali, 0A

Desse, Jean Michel, 1F

Diaz, Leonardo, 1V

Doval, Ángel F., 07

Dupont, Jan, 1B

Fabron, Christophe, 0J

Falaggis, Konstantinos, 08

Fernández, José L., 07

Finke, G., 19

Flores-Moreno, J. M., 1A

Fontana, Filipe, 06

Freyre, C., 1Q

Fukai, T., 10

Gadow, R., 0H

Garcia, José, 0J

Georges, Marc P., 02, 0J, 0N

Gorecki, Christophe, 0Z

Gren, Per, 0V, 1E

Grumel, Eduardo, 1Z

Hällstig, Emil, 1E

Hanson, Steen G., 0U, 1D, 1J

Hernández-Montes, María del Socorro, 0G, 12, 1A

Holdynski, Z., 0W

Ikuo, Kazuyuki, 18

Jackin, Boaz Jessie, 18

Jakobsen, Michael Linde, 0U, 1J

Jaroszewicz, L. R., 0W

Józwik, M., 19

Kadono, Hirofumi, 0A, 10

Khan, Gufran Sayeed, 11

Khodadad, Davood, 1E

Kiyohara, Kosuke, 18

Kiyohara, Motosuke, 18

Koch, Alexander W., 0Y

Kozacki, Tomasz, 08, 19

Kujawińska, Malgorzata, 08, 19

Kula, P., 0W

Kumar, Manoj, 0I, 0S, 11

Kumar, Varun, 0I, 0S

Le Brun, Guy, 0D, 0X

Le Jeune, Bernard, 0D, 0X

Lee, Tim K., 1D

Lehmann, Peter, 15

Li, Junchang, 1Y

Li, Yiling, 04

Lomer, M., 1S

López Vázquez, José Carlos, 07

Lopez, A. J., 1Q

Lopez-Higuera, J. M., 1S

Lothhammer, Lívia R., 06

Ma, Ning, 1D

Maciaszek, Thierry, 0J

Madruga, F., 1S

Makowski, P., 19

Malygin, A. S., 1M

Marc, P., 0W

Marcuzzi, P. A., 1Q

Márquez Aguilar, Pedro A., 0R

Martin, Laurent, 0J

Martínez-Celorio, R. A., 1U

Mazur, R., 0W

Melander, Emil, 1E

Mendoza, Fernando, 12

Mendoza Santoyo, Fernando, 12, 1A, 1I

Merta, I., 0W

Mikhailova, J. A., 1M

Miquet Romero, L. M., 1U

Molina Ocampo, Arturo, 0R

Montrésor, Silvio, 03

Mora Canales, Victor, 1Z

Mulone, C., 1Q

Muñoz, Silvino, 12

Muñoz-Solís, Silvino, 0G

Nassif, Rana, 0D, 0X

Niwa, Hayato, 18

Noguchi, Masato, 18

Novosyolova, I. A., 1M

Ono, Akira, 18

Onuma, Takashi, 18

Orlik, Xavier, 1B

Osten, W., 0H

Pacheco, Anderson, 06

Pedrini, G., 0H

Pellen, Fabrice, 0D, 0X

Peng, Zujie, 1Y

Peregrina-Barreto, Hayde, 1O

Perez-Corona, Cruz Elizabeth, 1O

Pérez-López, Carlos, 0O, 1A

Picart, Pascal, 03, 1F, 1Y

Piecek, W., 0W

Porras-Aguilar, R., 1X

Prieto, Eric, 0J

Quéhé, Pierre-Yves, 03

Rabal, Hector, 1Z

Ramil, A., 1Q

Ramírez-Miquet, E. E, 1U

Ramirez-San-Juan, Julio Cesar, 1O, 1X

Ramos-Garcia, Ruben, 1O, 1X

Rodriguez-Cobo, L., 1S

Saldaña Heredia, Alonso, 0R

Sanchez Preciado, J., 0O

Santiago-Lona, Cynthia V., 12

Shakher, Chandra, 0I, 0S, 11

Sjödahl, Mikael, 04, 0V, 1E

Song, Qinghe, 1Y

Takeda, Mitsuo, 1D

Thizy, Cédric, 0J, 0N

Toro, Jessica, 1V

Torres, Cesar O., 0B, 1P, 1V

Trillo, Cristina, 07

Trivi, Marcelo, 1Z

Uribe López, Ubaldo, 0G

Vandenrijt, Jean-François, 0J, 0N

Vega, Fabio, 0B, 1V

Veiga, Celso L. N., 06

Verhaeghe, Sophie, 03

Vincitorio, F. M., 1Q

Viotti, Matias R., 06

Vladimirov, A. P., 17, 1M

Wang, Wei, 1D

Weidmann, P., 0H

Xie, Weichang, 15

Yakin, D. I., 1M

Yatagai, Toyohiko, 18

Yoshii, Minoru, 18

Yura, H. T., 1J

Żak, J., 19

Zamudio Lara, Álvaro, 0R

Conference Committee

Conference Chairs

  • Fernando Mendoza Santoyo, Centro de Investigaciones en Óptica, A.C. (México)

  • Eugenio R. Méndez, Centro de Investigación Científica y de Educación Superior de Ensenada B.C. (México)

International Scientific Committee

  • Armando Albertazzi Gonçalves Jr., Universidade Federal de Santa Catarina (Brazil)

  • M. Pilar Arroyo, Universidad de Zaragoza (Spain)

  • Anand K. Asundi, Nanyang Technological University (Singapore)

  • Christian Depeursinge, École Polytechnique Fédérale de Lausanne (France)

  • Ángel M. Fernández Doval, Universidad de Vigo (Spain)

  • Pietro Ferraro, Istituto Nazionale di Ottica Applicata (Italy)

  • Cosme Furlong, Worcester Polytechnic Institute (United States)

  • Kay Gastinger, Norwegian University of Science and Technology (Norway)

  • Marc P. Georges, Université de Liège (Belgium)

  • Joseph W. Goodman, Stanford University (United States)

  • Jonathan M. Huntley, Loughborough University (United Kingdom)

  • Guillermo H. Kaufmann, Universidad Nacional de Rosario (Argentina)

  • Małgorzata Kujawińska, Warsaw University of Technology (Poland)

  • Wolfgang Osten, Universität Stuttgart (Germany)

  • Giancarlo Pedrini, Universität Stuttgart (Germany)

  • Pascal Picart, Université du Maine (France)

  • Ryszard J. Pryputniewicz, Worcester Polytechnic Institute (United States)

  • Nadya O. Reingand, CeLight Inc. (United States)

  • Ramon Rodriguez-Vera, Centro de Investigaciones en Óptica, A.C. (México)

  • Mikael Sjödahl, Luleå University of Technology (Sweden)

  • Pierre R. L. Slangen, École des Mines d'Alès (France)

  • Mitsuo Takeda, Utsunomiya University (Japan)

  • James D. Trolinger, MetroLaser, Inc. (United States)

  • Mario A. P. Vaz, Universidade do Porto (Portugal)

  • Ichirou Yamaguchi, RIKEN (Japan)

  • Toyohiko Yatagai, Utsunomiya University (Japan)

  • Cristina Trillo, Universidad de Vigo (Spain)

National Committee

  • Jose Rufino Díaz-Uribe, Universidad Nacional Autónoma de México (México)

  • Ricardo Legarda-Sáenz, Universidad Autónoma de Yucatán (México)

  • Raúl Rangel Rojo, Centro de Investigación Científica y de Educación Superior de Ensenada B.C. (México)

Local Committee

  • Manuel H. De la Torre-Ibarra, Centro de Investigaciones en Óptica, A.C. (México)

  • María del Socorro Hernández Montes, Centro de Investigaciones en Óptica, A.C. (México)

  • Mauricio Flores Moreno, Centro de Investigaciones en Óptica, A.C. (México)

  • Carlos Pérez López, Centro de Investigaciones en Óptica, A.C. (México)

Session Chairs

  • Session I

    Andrew J. Moore, Heriot-Watt University (United Kingdom)

  • Session II

    Hui Cao, Yale University (United States)

  • Session III

    Mikael Sjödahl, Luleå University of Technology (Sweden)

  • Session IV

    Małgorzata Kujawińska, Warsaw University of Technology (Poland)

  • Session V

    Aristide Dogariu, CREOL, The College of Optics and Photonics, University of Central Florida (United States)

  • Session VI

    Pascal Picart, Université du Maine (France)

  • Session VII

    Hirofumi Kadono, Saitama University (Japan)

  • Session VIII

    Wolfgang Osten, Universität Stuttgart (Germany)

  • Poster Session

    Manuel H. De la Torre-Ibarra, Centro de Investigaciones en Óptica, A.C. (México)

    Mauricio Flores Moreno, Centro de Investigaciones en Óptica, A.C. (México)

Introduction

Welcome to Mexico and the colonial city of Guanajuato, a UNESCO-designated World Heritage Site. This historical city, with its colors and its network of winding streets, has been chosen as the venue of the Sixth International Conference on Speckle Metrology (SPECKLE 2015). With participants coming from more than 20 different countries, the conference is a truly international event that forms part of Mexico's celebrations for the International Year of Light (IYL).

The conference is the latest of a series of meetings devoted to speckle phenomena and their wide range of applications. The goal of this conference is to gather scientists, engineers and students who work in the field of speckle metrology and related techniques, and provide a stimulating environment for discussions. We believe that the conference will provide a good picture of the state of the field and indicate new directions for future research. In this sense, the Conference Chairs encouraged the submission of papers on topics that were not included in the past, like the use of the speckle in spectroscopy, imaging through scattering media and biological sciences. The works will be presented in eight oral sessions and one poster session, for a total of 71 papers that cover subjects like speckle statistics, speckle interferometry, digital techniques in speckle, dynamic laser speckle, interaction of light with random media, and imaging and spectroscopic techniques involving speckle.

We encourage you to contribute to the exchange of up-to-date information in your fields of expertise and share your latest achievements with your colleagues. The meeting should be an opportunity to discuss with old friends and establish new contacts. Hopefully, it will be the starting point of many new joint ventures and research projects. Your active participation will contribute to the atmosphere that we are trying to promote.

We hope you enjoy the meeting.

Fernando Mendoza Santoyo

Eugenio R. Méndez

© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 9660", Proc. SPIE 9660, SPECKLE 2015: VI International Conference on Speckle Metrology, 966001 (24 August 2015); https://doi.org/10.1117/12.2206040
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Speckle

Digital Light Processing

Digital color imaging

Digital holography

Digital recording

Holographic interferometry

Signal processing

Back to Top