Sequential accelerated tests: Improving the correlation of accelerated tests to module performance in the field

Thomas Felder; William Gambogi; Katherine Stika; Bao-Ling Yu; Alex Bradley; Hongjie Hu; Lucie Garreau-Iles; T. John Trout

doi:10.1117/12.2239030

26 September 2016 Sequential accelerated tests: Improving the correlation of accelerated tests to module performance in the field

Thomas Felder, William Gambogi, Katherine Stika, Bao-Ling Yu, Alex Bradley, Hongjie Hu, Lucie Garreau-Iles, T. John Trout

Author Affiliations +

Proceedings Volume 9938, Reliability of Photovoltaic Cells, Modules, Components, and Systems IX; 993804 (2016) https://doi.org/10.1117/12.2239030
Event: SPIE Optics + Photonics for Sustainable Energy, 2016, San Diego, California, United States

Abstract

DuPont has been working steadily to develop accelerated backsheet tests that correlate with solar panels observations in the field. This report updates efforts in sequential testing. Single exposure tests are more commonly used and can be completed more quickly, and certain tests provide helpful predictions of certain backsheet failure modes. DuPont recommendations for single exposure tests are based on 25-year exposure levels for UV and humidity/temperature, and form a good basis for sequential test development. We recommend a sequential exposure of damp heat followed by UV then repetitions of thermal cycling and UVA. This sequence preserves 25-year exposure levels for humidity/temperature and UV, and correlates well with a large body of field observations. Measurements can be taken at intervals in the test, although the full test runs 10 months. A second, shorter sequential test based on damp heat and thermal cycling tests mechanical durability and correlates with loss of mechanical properties seen in the field. Ongoing work is directed toward shorter sequential tests that preserve good correlation to field data.

Citation Download Citation

Thomas Felder, William Gambogi, Katherine Stika, Bao-Ling Yu, Alex Bradley, Hongjie Hu, Lucie Garreau-Iles, and T. John Trout "Sequential accelerated tests: Improving the correlation of accelerated tests to module performance in the field", Proc. SPIE 9938, Reliability of Photovoltaic Cells, Modules, Components, and Systems IX, 993804 (26 September 2016); https://doi.org/10.1117/12.2239030

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available