Quantification of neutral mechanical plane shifting in bending elastomer film using cholesteric liquid crystal sensor (Conference Presentation)

Masayuki Kishino; Norihisa Akamatsu; Ryo Taguchi; Shoichi Kubo; Kyohei Hisano; Osamu Tsutsumi; Atsushi Shishido

doi:10.1117/12.2632003

3 October 2022 Quantification of neutral mechanical plane shifting in bending elastomer film using cholesteric liquid crystal sensor (Conference Presentation)

Masayuki Kishino, Norihisa Akamatsu, Ryo Taguchi, Shoichi Kubo, Kyohei Hisano, Osamu Tsutsumi, Atsushi Shishido

Author Affiliations +

Proceedings Volume PC12207, Liquid Crystals XXVI; PC1220703 (2022) https://doi.org/10.1117/12.2632003
Event: SPIE Organic Photonics + Electronics, 2022, San Diego, California, United States

Abstract

Flexible electronic devices composed of polymers and elastomers require high mechanical durability to maintain their performance during cyclic bending. To design the appropriate structure for such devices, it is important to identify the position of a neutral mechanical plane (NMP) where there is no strain inside a bending material. In this study, the NMP position of bending polydimethylsiloxane (PDMS) film, which is a common soft material used in flexible electronic devices, is experimentally identified through internal strain measurement using a cholesteric liquid crystal sensor. Notably, the NMP of the bending PDMS film reversibly shifts toward the inner bending surface. Further, considering the NMP shifting enables us to fabricate a flexible electronic device with high mechanical durability. Quantifying the NMP position facilitates the development of device designs for flexible electronics.

Conference Presentation

Citation Download Citation

Masayuki Kishino, Norihisa Akamatsu, Ryo Taguchi, Shoichi Kubo, Kyohei Hisano, Osamu Tsutsumi, and Atsushi Shishido "Quantification of neutral mechanical plane shifting in bending elastomer film using cholesteric liquid crystal sensor (Conference Presentation)", Proc. SPIE PC12207, Liquid Crystals XXVI, PC1220703 (3 October 2022); https://doi.org/10.1117/12.2632003

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available