Entanglement-enhanced precision metrology and sensing with integrated photonics

Galan Moody; Trevor Steiner

doi:10.1117/12.2657361

9 March 2023 Entanglement-enhanced precision metrology and sensing with integrated photonics

Galan Moody, Trevor Steiner

Proceedings Volume PC12447, Quantum Sensing, Imaging, and Precision Metrology; PC1244726 (2023) https://doi.org/10.1117/12.2657361
Event: SPIE Quantum West, 2023, San Francisco, California, United States

Abstract

Quantum sensing and measurement devices are reaching a new level of accuracy for high-precision measurements, allowing detection of the most minute changes in magnetic, electric, and strain fields, gravity, and time. In this talk, I will present an overview of how integrated photonic and nanophotonic devices utilize entanglement to improve measurement accuracy and sensitivity. Examples will include the development of ultrabright and ultra-efficient quantum light sources as resources for sensors, integrated photonic magnetometry with exquisite sensitivity that can be further enhanced with squeezing, and strain sensors based on optomechanical modulation of quantum emitters via surface acoustic wave resonators.

Conference Presentation

Citation Download Citation

Galan Moody and Trevor Steiner "Entanglement-enhanced precision metrology and sensing with integrated photonics", Proc. SPIE PC12447, Quantum Sensing, Imaging, and Precision Metrology, PC1244726 (9 March 2023); https://doi.org/10.1117/12.2657361

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