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13 March 2024 Recent advances in microLED performance: efficiency, gamut, and reliability
Brendan Moran, Mark J. Holmes, Joseph Flemish, Robert Armitage, Zhongmin Ren, Hee Jin Kim, Rajiv Pathak, Oleg Shchekin, Hossein Lotfi
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Proceedings Volume PC12906, Light-Emitting Devices, Materials, and Applications XXVIII; PC1290601 (2024) https://doi.org/10.1117/12.3001933
Event: SPIE OPTO, 2024, San Francisco, California, United States
Abstract
We discuss state of the art microLED performance for AR and direct view display applications, including a detailed comparison of both InGaN and AlInGaP material systems at various sizes from <2micron to >10micron pixels. In particular, we detail our most recent results on efficiency, gamut coverage, and reliability. We also quantify how sidewall passivation can lead to high IQE for 2 micron scale devices. Further we describe early results for a polychromatic LED demonstration that represents a possible breakthrough display technology.
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Brendan Moran, Mark J. Holmes, Joseph Flemish, Robert Armitage, Zhongmin Ren, Hee Jin Kim, Rajiv Pathak, Oleg Shchekin, and Hossein Lotfi "Recent advances in microLED performance: efficiency, gamut, and reliability", Proc. SPIE PC12906, Light-Emitting Devices, Materials, and Applications XXVIII, PC1290601 (13 March 2024); https://doi.org/10.1117/12.3001933
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KEYWORDS
Reliability
Indium gallium nitride
External quantum efficiency
Aluminium gallium indium phosphide
Design and modelling
Epitaxy
Manufacturing
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