CONFERENCE PROCEEDINGS
Advanced Search
Home > Proceedings > Volume PC12912 > Article
Presentation
13 March 2024 Pushing the understanding of quantum defects in silicon ahead to tailor quantum sensing by low-gain avalanche detectors
Kevin Lauer, Stephanie Reiss, Andreas Frank, Aaron Flötotto, Katharina Peh, Dominik Bratek, Robin Müller, Dirk Schulze, Stefan Krischok, Wichard Beenken, Erich Runge, Erik Hiller, Thomas Ortlepp, Andreas T. Winzer
Author Affiliations +
Proceedings Volume PC12912, Quantum Sensing, Imaging, and Precision Metrology II; PC129121S (2024) https://doi.org/10.1117/12.2691654
Event: SPIE Quantum West, 2024, San Francisco, California, United States
Abstract
Numerous precision metrology systems for detecting quanta of any kind are based on silicon detectors. Recently, low-gain avalanche detectors (LGAD) with fast response and reduced noise level have been proposed. Beneficial applications of LGADs developed by CiS [1] in quantum detection e.g. in electron detection systems will be shown. Nevertheless, under strong irradiation the gain layer of theses LGADs disappears possibly due to formation of ASi-Sii-defects.[2] These defects are point defects in silicon with several metastable configurations in 3 charge states. These are controllable e.g. by light and temperature. Some of them are luminescing, making this defect an interesting candidate in quantum applications, as well. Targeted manipulation by light and temperature of these PL lines in the indium (InSi-Sii) and thallium (TlSi-Sii) case will be shown. Progress in ASi-Sii-defect modelling will be presented and implications for LGAD development and applications in quantum science of these intereseting defcts in silicon are pushed forward. [1] K. Lauer et al., Phys. Status Solidi A 219(17), 2200177 (2022). [2] K. Lauer et al., Phys. Status Solidi A 219(19), 2200099 (2022).
Conference Presentation
© (2024) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation Download Citation
Kevin Lauer, Stephanie Reiss, Andreas Frank, Aaron Flötotto, Katharina Peh, Dominik Bratek, Robin Müller, Dirk Schulze, Stefan Krischok, Wichard Beenken, Erich Runge, Erik Hiller, Thomas Ortlepp, and Andreas T. Winzer "Pushing the understanding of quantum defects in silicon ahead to tailor quantum sensing by low-gain avalanche detectors", Proc. SPIE PC12912, Quantum Sensing, Imaging, and Precision Metrology II, PC129121S (13 March 2024); https://doi.org/10.1117/12.2691654
ACCESS THE FULL ARTICLE
ORGANIZATIONAL
Sign in with credentials provided by your organization.
INSTITUTIONAL
Select your institution to access the SPIE Digital Library.
SELECT YOUR INSTITUTION
PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
PERSONAL SIGN IN
No SPIE Account? Create one
PURCHASE THIS CONTENT
SUBSCRIBE TO DIGITAL LIBRARY
50 downloads per 1-year subscription
Members: $195
Non-members: $335 ADD TO CART
25 downloads per 1 - year subscription
Members: $145
Non-members: $250 ADD TO CART
PURCHASE SINGLE ARTICLE
Includes PDF, HTML & Video, when available
Members: $17.00
Non-members: $21.00 ADD TO CART
PROCEEDINGS
 PRESENTATION
WATCH
PRESENTATION SAVE TO MY LIBRARY
GET CITATION
Advertisement
Advertisement
KEYWORDS
Silicon
Quantum detection
Quantum phenomena
Quantum sensing
Boron
Chemical species
Luminescence
RELATED CONTENT
Subscribe to Digital Library
Receive Erratum Email Alert
Back to Top