Measurements of laser diode astigmatism using the beam-line method

Yakov S. Sidorin; Roland V. Shack

doi:10.1117/1.1369596

1 June 2001 Measurements of laser diode astigmatism using the beam-line method

Yakov S. Sidorin, Roland V. Shack

Optical Engineering, Vol. 40, Issue 6, (June 2001). https://doi.org/10.1117/1.1369596

We propose a novel method to measure the astigmatism of laser diodes that is based solely on power measurements and does not require the use of any imaging system. Experimental realization of this method resulted in a sensitive measuring technique. Using it, a linear dependence of astigmatism change on drive current is demonstrated for commercial index-guided laser structures. The proposed method is believed to be highly adaptable to any experimental environment. Its advantages over currently employed methods are discussed.

©(2001) Society of Photo-Optical Instrumentation Engineers (SPIE)

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Yakov S. Sidorin and Roland V. Shack "Measurements of laser diode astigmatism using the beam-line method," Optical Engineering 40(6), (1 June 2001). https://doi.org/10.1117/1.1369596

Published: 1 June 2001

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