Open Access
1 June 2018 Feature enhancement for a defocusing structured-light 3-D scanning system
Yu-Lun Liu, Tzung-Han Lin
Author Affiliations +
Abstract
Structured-light systems consisting of a camera and projector are powerful and cost-effective tools for three-dimensional (3-D) shape measurements. However, most commercial projectors are unable to generate distinct patterns due to defocusing and shallow focusing issues. We propose a hybrid method for enhancing the calibration and scanning features of the defocusing structured-light 3-D scanning system. Instead of using conventional sequential binary patterns, we replace the highest-level binary pattern by a high-order sinusoidal pattern. In our proposed system, a pan-tilt stage carrying a checkerboard is used to assist the simultaneous calibration of the camera and projector. Initially, the camera is calibrated to obtain the extrinsic positions of the stage. In addition, we utilize the multiplication of vertical and horizontal stripe patterns to enhance the corresponding features between the camera and projector. The projector is then calibrated using the extrinsic features determined from the calibrated camera. The experimental results show that the use of the high-order sinusoidal pattern significantly improves reprojection error. Our proposed method can easily be incorporated in the defocusing projector for scanning various types of objects.
CC BY: © The Authors. Published by SPIE under a Creative Commons Attribution 4.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.
Yu-Lun Liu and Tzung-Han Lin "Feature enhancement for a defocusing structured-light 3-D scanning system," Optical Engineering 57(6), 064101 (1 June 2018). https://doi.org/10.1117/1.OE.57.6.064101
Received: 29 January 2018; Accepted: 15 May 2018; Published: 1 June 2018
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Projection systems

Cameras

Calibration

3D scanning

Imaging systems

Distortion

Binary data

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