18 June 2021 Absolute phase retrieval for a single-shot fringe projection profilometry based on deep learning
Wenjian Li, Jian Yu, Shaoyan Gai, Feipeng Da
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Abstract

A deep learning-based method is proposed to recover the absolute phase value from a single fringe pattern. We propose a deep neural network architecture that includes two subnetworks used for wrapping phase calculation and phase unwrapping, respectively. The training set is generated with the absolute phase obtained by the combination of phase shifting and gray coding. In addition, a reference plane is adopted to provide periodic range information for phase unwrapping. Then according to the output of the well-trained network, a high-quality absolute phase is obtained through only a single fringe pattern of the measured object. Experiments on the test set verify that high accuracy for complex texture objects is acquired using the proposed method, which indicates its potential in high-speed measurement.

© 2021 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286/2021/$28.00 © 2021 SPIE
Wenjian Li, Jian Yu, Shaoyan Gai, and Feipeng Da "Absolute phase retrieval for a single-shot fringe projection profilometry based on deep learning," Optical Engineering 60(6), 064104 (18 June 2021). https://doi.org/10.1117/1.OE.60.6.064104
Received: 9 March 2021; Accepted: 2 June 2021; Published: 18 June 2021
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CITATIONS
Cited by 13 scholarly publications.
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KEYWORDS
Fringe analysis

Error analysis

Phase retrieval

Picosecond phenomena

Optical engineering

Convolution

Cameras

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